Application of molecular markers in breeding for bean common blight resistance in South Africa
Sequence characterised amplified region (SCAR) markers, linked to four independent quantitative trait loci (QTL) in XAN 159 and GN #1 Nebr. sel. 27, are available for indirect selection of resistance to common bacterial blight in Phaseolus vulgaris. Existing SCAR-markers, SU91, BC420, BC409 and SAP6...
| Main Authors: | , |
|---|---|
| Format: | Journal Article |
| Language: | Inglés |
| Published: |
African Crop Science Society
2011
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10568/97075 |
Similar Items: Application of molecular markers in breeding for bean common blight resistance in South Africa
- Resistance and inheritance of common bacterial blight in yellow bean
- Common Bacterial Blight (CBB)
- Inheritance of resistance to common bacterial blight in common bean
- Improvement of common bacterial blight resistance in South African dry bean cultiver teebus
- International Bean Improvement Cooperative (BIC) and North American Pulse Improvement Association (NAPIA) Biennial Meeting, hosted by the University of Nebraska-Lincoln. Presentations by the Bean Program
- A Review of Angular Leaf Spot Resistance in Common Bean