Genome-wide association mapping for resistance against Septoria nodorum blotch and tan spot in a diverse wheat panel
Septoria nodorum blotch (SNB) and tan spot (TS) are two globally significant foliar diseases affecting wheat, causing substantial reductions in both yield and grain quality. In this study, genome-wide association study (GWAS) was conducted using an elite diversity panel comprising 150 lines to ident...
| Main Authors: | , , , , , |
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| Format: | Journal Article |
| Language: | Inglés |
| Published: |
Springer
2025
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10568/178130 |
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