A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
Southern corn leaf blight (SCLB), caused by the fungus Bipolaris maydis, is a disease that significantly affects maize productivity across the globe. A detached leaf assay (DLA) was developed to rapidly assess maize resistance to SCLB. Several experiments were conducted to: (i) identify a highly vir...
| Main Authors: | , , , , , |
|---|---|
| Format: | Journal Article |
| Language: | Inglés |
| Published: |
Springer
2020
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10568/106319 |
Similar Items: A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
- Histone ZmH2B regulates resistance to the Southern corn leaf blight pathogen Bipolaris maydis in maize
- Rapid and mass screening of banana and plantain for resistance to Black sigatoka disease using detached leaf and in vitro plantlets
- Desarrollo de la mancha foliar por Bipolaris maydis (teleomorfo: Cochliobolus heterostrophus) en maíz dulce, en función de nitrógeno, potasio y silicio en invernadero
- Genotypic variability and aggressiveness of Bipolaris oryzae in the Philippines
- Phylogenetic analysis based on ITS sequences and conditions affecting the type of conidial germination of Bipolaris oryzae
- Pattern analysis of sorghum genotype x environment interaction for leaf, panicle, and grain anthracnose in Mali