A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight

Southern corn leaf blight (SCLB), caused by the fungus Bipolaris maydis, is a disease that significantly affects maize productivity across the globe. A detached leaf assay (DLA) was developed to rapidly assess maize resistance to SCLB. Several experiments were conducted to: (i) identify a highly vir...

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Autores principales: Aregbesola, E., Ortega Beltran, A., Falade, Titilayo D.O., Jonathan, G., Hearne, S., Bandyopadhyay, Ranajit
Formato: Journal Article
Lenguaje:Inglés
Publicado: Springer 2020
Materias:
Acceso en línea:https://hdl.handle.net/10568/106319
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author Aregbesola, E.
Ortega Beltran, A.
Falade, Titilayo D.O.
Jonathan, G.
Hearne, S.
Bandyopadhyay, Ranajit
author_browse Aregbesola, E.
Bandyopadhyay, Ranajit
Falade, Titilayo D.O.
Hearne, S.
Jonathan, G.
Ortega Beltran, A.
author_facet Aregbesola, E.
Ortega Beltran, A.
Falade, Titilayo D.O.
Jonathan, G.
Hearne, S.
Bandyopadhyay, Ranajit
author_sort Aregbesola, E.
collection Repository of Agricultural Research Outputs (CGSpace)
description Southern corn leaf blight (SCLB), caused by the fungus Bipolaris maydis, is a disease that significantly affects maize productivity across the globe. A detached leaf assay (DLA) was developed to rapidly assess maize resistance to SCLB. Several experiments were conducted to: (i) identify a highly virulent B. maydis isolate; and to determine the most appropriate (ii) phytohormone to maintain viability of maize leaf tissue, (iii) leaf age for the assay, and (iv) inoculum concentration. Once optimized, the DLA was compared with screenhouse and field experiments. Use of DLA required a maximum of 28 days for resistance assessment, in contrast to screenhouse and field tests at a minimum of 33 and 72 days, respectively. DLA positively correlated with screenhouse (r = 0.48, P = 0.08) and field experiments (r = 0.68, P = 0.008). Assessments of diverse B. maydis strains and host genotypes indicated that the DLA could be used to detect both highly virulent SCLB strains and highly resistant maize genotypes. Here we report that DLA is a rapid, reliable technique to screen maize resistance to SCLB. Use of this tool in maize breeding programs can speed up the process of identification of sources of resistance to multiple variants of SCLB.
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spelling CGSpace1063192025-11-11T10:16:10Z A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight Aregbesola, E. Ortega Beltran, A. Falade, Titilayo D.O. Jonathan, G. Hearne, S. Bandyopadhyay, Ranajit disease resistance screening methods maize breeding cochliobolus heterostrophus Southern corn leaf blight (SCLB), caused by the fungus Bipolaris maydis, is a disease that significantly affects maize productivity across the globe. A detached leaf assay (DLA) was developed to rapidly assess maize resistance to SCLB. Several experiments were conducted to: (i) identify a highly virulent B. maydis isolate; and to determine the most appropriate (ii) phytohormone to maintain viability of maize leaf tissue, (iii) leaf age for the assay, and (iv) inoculum concentration. Once optimized, the DLA was compared with screenhouse and field experiments. Use of DLA required a maximum of 28 days for resistance assessment, in contrast to screenhouse and field tests at a minimum of 33 and 72 days, respectively. DLA positively correlated with screenhouse (r = 0.48, P = 0.08) and field experiments (r = 0.68, P = 0.008). Assessments of diverse B. maydis strains and host genotypes indicated that the DLA could be used to detect both highly virulent SCLB strains and highly resistant maize genotypes. Here we report that DLA is a rapid, reliable technique to screen maize resistance to SCLB. Use of this tool in maize breeding programs can speed up the process of identification of sources of resistance to multiple variants of SCLB. 2020-01 2019-12-23T09:15:03Z 2019-12-23T09:15:03Z Journal Article https://hdl.handle.net/10568/106319 en Open Access application/pdf Springer Aregbesola, E., Ortega-Beltran, A., Falade, T., Jonathan, G., Hearne, S. & Bandyopadhyay, R. (2019). A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight. European Journal of Plant Pathology, 1-13.
spellingShingle disease resistance
screening
methods
maize
breeding
cochliobolus heterostrophus
Aregbesola, E.
Ortega Beltran, A.
Falade, Titilayo D.O.
Jonathan, G.
Hearne, S.
Bandyopadhyay, Ranajit
A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
title A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
title_full A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
title_fullStr A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
title_full_unstemmed A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
title_short A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
title_sort detached leaf assay to rapidly screen for resistance of maize to bipolaris maydis the causal agent of southern corn leaf blight
topic disease resistance
screening
methods
maize
breeding
cochliobolus heterostrophus
url https://hdl.handle.net/10568/106319
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