Linking process-based potato models with light reflectance data: Does model complexity enhance yield prediction accuracy?
Data acquisition for parameterization is one of the most important limitations for the use of potato crop growth models. Non destructive techniques such as remote sensing for gathering required data could circumvent this limitation. Our goal was to analyze the effects of incorporating ground-based s...
| Autores principales: | , , , , , |
|---|---|
| Formato: | Journal Article |
| Lenguaje: | Inglés |
| Publicado: |
Elsevier
2017
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| Materias: | |
| Acceso en línea: | https://hdl.handle.net/10568/78288 |
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