Resistance of Kenyan wheat germplasm to Fusarium head blight and deoxynivalenol contamination

Fusarium head blight (FHB) of wheat causes quantitative and qualitative reduction in yield. Cultivar resistance is the most effective method of managing the disease. This study evaluated the resistance of wheat germplasm currently available in Kenya to Fusarium head blight and deoxynivalenol (DON) c...

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Bibliographic Details
Main Authors: Okumu, O.O., Muthomi, J.W., Mutegi, C.K., Wagacha, J.M.
Format: Journal Article
Language:Inglés
Published: 2016
Subjects:
Online Access:https://hdl.handle.net/10568/77329

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