Pathogenic variability of Phaeoisariopsis griseola in Kenya and its implications in resistance of common bean to angular leaf spot
| Autores principales: | , , , , |
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| Formato: | Conference Paper |
| Lenguaje: | Inglés |
| Publicado: |
Rockefeller Foundation
2005
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| Materias: | |
| Acceso en línea: | https://hdl.handle.net/10568/65526 |
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