Selection of marketable bean lines with improved resistance to angular leaf spot, root rot and yield potential for smallholder farmers in eastern and central Africa

Detalles Bibliográficos
Autores principales: Kimani, P.M., Buruchara, Robin Arani, Muthamia, JGN, Mbikayi, NT, Namayanja, AR, Otsyina, R.M., Blair, Matthew W.
Formato: Conference Paper
Lenguaje:Inglés
Publicado: Rockefeller Foundation 2005
Materias:
Acceso en línea:https://hdl.handle.net/10568/65522
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