Cita APA (7a ed.)
Wang, D., He, X., Deng, Z., Reynolds, M. P., Dreisigacker, S., & Singh, P. K. (2025). Genome-wide association mapping for resistance against Septoria nodorum blotch and tan spot in a diverse wheat panel. Springer.
Cita Chicago Style (17a ed.)
Wang, Dehua, Xinyao He, Zhiying Deng, Matthew P. Reynolds, Susanne Dreisigacker, y Pawan Kumar Singh. Genome-wide Association Mapping for Resistance Against Septoria Nodorum Blotch and Tan Spot in a Diverse Wheat Panel. Springer, 2025.
Cita MLA (9a ed.)
Wang, Dehua, et al. Genome-wide Association Mapping for Resistance Against Septoria Nodorum Blotch and Tan Spot in a Diverse Wheat Panel. Springer, 2025.
Precaución: Estas citas no son 100% exactas.