A combination of joint linkage and genome-wide association study reveals putative candidate genes associated with resistance to northern corn leaf blight in tropical maize
Northern corn leaf blight (NCLB), caused by Setosphaeria turcica, is a major fungal disease affecting maize production in sub-Saharan Africa. Utilizing host plant resistance to mitigate yield losses associated with NCLB can serve as a cost-effective strategy. In this study, we conducted a high-resol...
| Main Authors: | , , , , , , , , , , , , |
|---|---|
| Format: | Journal Article |
| Language: | Inglés |
| Published: |
Frontiers Media
2024
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10568/169952 |
Similar Items: A combination of joint linkage and genome-wide association study reveals putative candidate genes associated with resistance to northern corn leaf blight in tropical maize
- Genome-wide association mapping and genomic prediction analyses reveal the genetic architecture of grain yield and agronomic traits under drought and optimum conditions in maize
- Identification of gray leaf spot–resistant donor lines in tropical maize germplasm and their agronomic performance under artificial inoculation
- Combination of linkage and association mapping with genomic prediction to infer QTL regions associated with gray leaf spot and northern corn leaf blight resistance in tropical maize
- Genomic loci associated with grain yield under well-watered and water-stressed conditions in multiple bi-parental maize populations
- Linkage mapping and genomic prediction of grain quality traits in tropical maize (Zea mays L.)
- Tackling Maize Lethal Necrosis (MLN) in eastern Africa through effective phytosanitary approaches