Genome-wide association mapping indicates quantitative genetic control of spot blotch resistance in bread wheat and the favorable effects of some spot blotch loci on grain yield
Spot blotch caused by the fungus Bipolaris sorokiniana poses a serious threat to bread wheat production in warm and humid wheat-growing regions of the world. Hence, the major objective of this study was to identify consistent genotyping-by-sequencing (GBS) markers associated with spot blotch resista...
| Autores principales: | , , , , , , , , , , , , , |
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| Formato: | Journal Article |
| Lenguaje: | Inglés |
| Publicado: |
Frontiers Media
2022
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| Materias: | |
| Acceso en línea: | https://hdl.handle.net/10568/126541 |
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