Obua, T., Sserumaga, J., Tukamuhabwa, P., Namara, M., Awio, B., Mugarra, J., . . . Chigeza, G. (2024). Unravelling yield and yield-related traits in soybean using GGE biplot and path analysis. MDPI.
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Chicago Style (17th ed.) Citation
Obua, T., J.P Sserumaga, P. Tukamuhabwa, M. Namara, B. Awio, J. Mugarra, G. Tusiime, and G. Chigeza. Unravelling Yield and Yield-related Traits in Soybean Using GGE Biplot and Path Analysis. MDPI, 2024.
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MLA (9th ed.) Citation
Obua, T., et al. Unravelling Yield and Yield-related Traits in Soybean Using GGE Biplot and Path Analysis. MDPI, 2024.
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Warning: These citations may not always be 100% accurate.