Authors: Sundarapandian, Balasubramanian, Yassine, Ali, Kirste, Lutz, Baeumler, Martina, Straňák, Patrik, Fisslthaler, Evelin, Prescher, Mario, Yassine, Mohamed, Nair, Akash, Raghuwanshi, Mohit, Ambacher, Oliver

Source: Journal of Applied Physics; 11/14/2023, Vol. 134 Issue 18, p1-10, 10p

Subject Terms: ALUMINUM nitride films, ACOUSTIC surface waves, SCANNING transmission electron microscopy, CRYSTAL texture, SECONDARY ion mass spectrometry, ATOMIC force microscopy, MAGNETRON sputtering

Authors: Kedia, Sanjay Kumar, Sharma, Nikita, Pandey, Lalit, Chaudhary, Sujeet

Source: Journal of Applied Physics; 11/7/2023, Vol. 134 Issue 17, p1-16, 16p

Subject Terms: MAGNETORESISTANCE, INTERFACIAL roughness, TRANSMISSION electron microscopy, GRAIN size, THIN films, IRON-nickel alloys

Authors: McKinstry, Michael P., Joshi, Sameehan S., Mani Krishna, K. V., Radhakrishnan, M., Dahotre, Narendra B.

Source: Journal of Applied Physics; 10/28/2023, Vol. 134 Issue 16, p1-10, 10p

Subject Terms: AMORPHOUS alloys, MAGNETOSTRICTION, LASERS, DIFFERENTIAL scanning calorimetry, TRANSMISSION electron microscopy, LASER beams

Authors: Nakagawa, Ryusuke, Watanabe, Rikuta, Miyashita, Naoya, Yamaguchi, Koichi

Source: Journal of Applied Physics; 10/21/2023, Vol. 134 Issue 15, p1-7, 7p

Subject Terms: NANOWIRES, SILICON nanowires, MOLECULAR beam epitaxy, ELECTRON beams, X-ray photoelectron spectroscopy, ATOMIC force microscopy, TRANSMISSION electron microscopy

Authors: Ji, Yihong, Frentrup, Martin, Zhang, Xiaotian, Pongrácz, Jakub, Fairclough, Simon M., Liu, Yingjun, Zhu, Tongtong, Oliver, Rachel A.

Source: Journal of Applied Physics; 10/14/2023, Vol. 134 Issue 14, p1-10, 10p

Subject Terms: INDIUM gallium nitride, LATTICE constants, TRANSMISSION electron microscopy, NUCLEAR forces (Physics), QUANTUM wells

Authors: Horváth, Ákos, Sulyok, Attila, Dücső, Csaba, Schiller, Robert

Source: Journal of Applied Physics; 10/14/2023, Vol. 134 Issue 14, p1-6, 6p

Subject Terms: ELECTRON work function, PLANCK'S constant, VACUUM deposition, ELECTRON spectroscopy, X-ray photoelectron spectroscopy, TRANSMISSION electron microscopy

Authors: Karafiludis, Stephanos, Scoppola, Ernesto, Wolf, Stephan E., Kochovski, Zdravko, Matzdorff, David, Van Driessche, Alexander E. S., Hövelmann, Jörn, Emmerling, Franziska, Stawski, Tomasz M.

Source: Journal of Chemical Physics; 10/7/2023, Vol. 159 Issue 13, p1-12, 12p

Subject Terms: PHASE separation, CRYSTAL growth, TRANSMISSION electron microscopy, MAGNESIUM phosphate, AMMONIUM phosphates, X-ray scattering

Authors: Fanetti, Samuele, Romi, Sebastiano, Berretti, Enrico, Hanfland, Michael, Mijit, Emin, Alabarse, Frederico, Dalladay-Simpson, Philip, Gorelli, Federico, Bini, Roberto, Santoro, Mario

Source: Journal of Chemical Physics; 10/7/2023, Vol. 159 Issue 13, p1-11, 11p

Subject Terms: CONDENSATION reactions, CHEMICAL amplification, CHEMICAL bonds, DIAMOND anvil cell, TRANSMISSION electron microscopy

Authors: Perna, Allison N., Schulte, Kevin L., Simon, John, Braun, Anna K., Diercks, David R., Packard, Corinne E., Ptak, Aaron J.

Source: Journal of Applied Physics; 10/7/2023, Vol. 134 Issue 13, p1-11, 11p

Subject Terms: PHOTOVOLTAIC power systems, SOLAR cells, SCANNING transmission electron microscopy, AUGER electron spectroscopy, OPEN-circuit voltage

Authors: Pan, Wenwu, Ma, Shuo, Sun, Xiao, Gu, Renjie, Faraone, Lorenzo, Lei, Wen

Source: Journal of Applied Physics; 9/21/2023, Vol. 134 Issue 11, p1-8, 8p

Subject Terms: MOLECULAR beam epitaxy, INFRARED detectors, THIN films, TRANSMISSION electron microscopy, X-ray diffraction, REFLECTANCE spectroscopy

Authors: Kuroki, Masanari, Horide, Tomoya, Matsumoto, Kaname, Ishimaru, Manabu

Source: Journal of Applied Physics; 7/28/2023, Vol. 134 Issue 4, p1-7, 7p

Subject Terms: THIN films, TRANSMISSION electron microscopy, HETEROGENEITY, HIGH resolution imaging, SCANNING electron microscopy, SCANNING transmission electron microscopy

Authors: Schmidt, Anja^1,2 (AUTHOR), Bittmann-Hennes, Birgit² (AUTHOR), Montero, Belén¹ (AUTHOR) belen.montero@udc.es, Wetzel, Bernd² (AUTHOR), Barral, Luis¹ (AUTHOR)

Source: Journal of Polymers & the Environment. Nov2023, Vol. 31 Issue 11, p4801-4816. 16p.

Subject Terms: *Waste paper, Cellulose nanocrystals, Polyhydroxybutyrate, Dynamic mechanical analysis, Vapor barriers, Transmission electron microscopy, Injection molding

Authors: Azizli, Mohammad Javad^1,2 (AUTHOR) Mohammadjavad.azizli@gmail.com, Ghadami, Azam³ (AUTHOR), Vafa, Ehsan⁴ (AUTHOR), Rezaeeparto, Katayoon⁵ (AUTHOR), Parham, Somayeh⁵ (AUTHOR), Mokhtary, Masoud¹ (AUTHOR), Jahankhah, Zahra⁵ (AUTHOR), Azizli, Fatemeh⁶ (AUTHOR), Bazargan-Lari, Reza⁷ (AUTHOR), Amani, Ali Mohammad⁴ (AUTHOR)

Source: Journal of Polymers & the Environment. Oct2023, Vol. 31 Issue 10, p4193-4209. 17p.

Subject Terms: Graphene oxide, Compatibilizers, Polyamides, Nanocomposite materials, Transmission electron microscopy, Tensile strength, Rheology

Authors: Nobahar, Amir^1,2 (AUTHOR), Carlier, Jorge Dias¹ (AUTHOR) jcarlier@ualg.pt, Costa, Maria Clara^1,2 (AUTHOR) mcorada@ualg.pt

Source: Clean Technologies & Environmental Policy. Oct2023, Vol. 25 Issue 8, p2707-2726. 20p.

Subject Terms: *Plant extracts, *Metals, *Leaching, Scanning transmission electron microscopy, Fourier transform infrared spectroscopy, Phytochemicals

Authors: El Hageali, Sami A., Guthrey, Harvey, Johnston, Steven, Norman, Andrew, Soto, Jake, Odekirk, Bruce, Stahlbush, Robert E., Mahadik, Nadeemullah A., Gorman, Brian P., Al-Jassim, Mowafak

Source: Journal of Applied Physics; 8/21/2023, Vol. 134 Issue 7, p1-17, 17p

Subject Terms: EPITAXIAL layers, TRANSMISSION electron microscopy, METAL oxide semiconductor field-effect transistors

Authors: Gupta, Sanju, Sharits, Andrew, Boeckl, John

Source: Journal of Applied Physics; 8/21/2023, Vol. 134 Issue 7, p1-10, 10p

Subject Terms: CARBON foams, SCANNING transmission electron microscopy, AEROGELS, MULTIWALLED carbon nanotubes, HYBRID materials, MORPHOMETRICS

Authors: Guillemin, S., Gergaud, P., Bernier, N., Merlin, M., Delwail, C., Minoret, S., Famulok, R., Gregoire, M., Nemouchi, F., Rodriguez, Ph.

Source: Journal of Applied Physics; 7/21/2023, Vol. 134 Issue 3, p1-12, 12p

Subject Terms: X-ray diffraction, TRANSMISSION electron microscopy, DIFFUSION control, THIN films, NUCLEATION

Authors: Snure, Michael, Blanton, Eric W., Soukhoveev, Vitali, Vogt, Timothy, Osinsky, Andrei, Prusnick, Timothy, Kennedy, W. Joshua, Glavin, Nicholas R.

Source: Journal of Applied Physics; 7/14/2023, Vol. 134 Issue 2, p1-11, 11p

Subject Terms: ELECTRON energy loss spectroscopy, SAPPHIRES, SCANNING transmission electron microscopy, GALLIUM nitride, ATOMIC force microscopy, BORON nitride

Authors: Jernigan, Glenn G., Mahadik, Nadeemullah A., Twigg, Mark E., Jackson, Eric M., Nolde, Jill A.

Source: Journal of Applied Physics; 7/14/2023, Vol. 134 Issue 2, p1-7, 7p

Subject Terms: BUFFER layers, MOLECULAR beam epitaxy, ATOMIC force microscopy, TRANSMISSION electron microscopy, LATTICE constants

Authors: Pingen, Katrin, Neuhaus, Stefan, Wolff, Niklas, Kienle, Lorenz, Žukauskaitė, Agnė, von Hauff, Elizabeth, Hinz, Alexander M.

Source: Journal of Applied Physics; 7/14/2023, Vol. 134 Issue 2, p1-6, 6p

Subject Terms: MAGNETRON sputtering, EPITAXY, CRYSTALLINITY, TECHNOLOGICAL innovations, TRANSMISSION electron microscopy, PLASMA etching

Geographic Terms: MOORE (Okla.)