Authors: An, F.P., Balantekin, A.B., Band, H.R., Bishai, M., Blyth, S., Cao, D., Cao, G.F., Cao, J., Cen, W.R., Chan, Y.L., Chang, J.F., Chang, L.C., Chang, Y., Chen, H.S., Chen, Q.Y., Chen, S.M., Chen, Y.X., Chen, Y., Cheng, J.H., Cheng, J., Cheng, Y.P., Cheng, Z.K., Cherwinka, J.J., Chu, M.C., Chukanov, A., Cummings, J.P., de Arcos, J., Deng, Z.Y., Ding, X.F., Ding, Y.Y., Diwan, M.V., Dolgareva, M., Dove, J., Dwyer, D.A., Edwards, W.R., Gill, R., Gonchar, M., Gong, G.H., Gong, H., Grassi, M., Gu, W.Q., Guan, M.Y., Guo, L., Guo, R.P., Guo, X.H., Guo, Z., Hackenburg, R.W., Han, R., Hans, S., He, M., Heeger, K.M., Heng, Y.K., Higuera, A., Hor, Y.K., Hsiung, Y.B., Hu, B.Z., Hu, T., Hu, W., Huang, E.C., Huang, H.X., Huang, X.T., Huber, P., Huo, W., Hussain, G., Jaffe, D.E., Jaffke, P., Jen, K.L., Jetter, S., Ji, X.P., Ji, X.L., Jiao, J.B., Johnson, R.A., Jones, D., Joshi, J., Kang, L., Kettell, S.H., Kohn, S., Kramer, M., Kwan, K.K., Kwok, M.W., Kwok, T., Langford, T.J., Lau, K., Lebanowski, L., Lee, J., Lee, J.H.C., Lei, R.T., Leitner, R., Li, C., Li, D.J., Li, F., Li, G.S., Li, Q.J., Li, S., Li, S.C., Li, W.D., Li, X.N., Li, Y.F., Li, Z.B., Liang, H., Lin, C.J., Lin, G.L., Lin, S., Lin, S.K., Lin, Y.C., Ling, J.J., Link, J.M., Littenberg, L., Littlejohn, B.R., Liu, D.W., Liu, J.L., Liu, J.C., Loh, C.W., Lu, C., Lu, H.Q., Lu, J.S., Luk, K.B., Lv, Z., Ma, Q.M., Ma, X.Y., Ma, X.B., Ma, Y.Q., Malyshkin, Y., Martinez Caicedo, D.A., McDonald, K.T., McKeown, R.D., Mitchell, I., Mooney, M., Nakajima, Y., Napolitano, J., Naumov, D., Naumova, E., Ngai, H.Y., Ning, Z., Ochoa-Ricoux, J.P., Olshevskiy, A., Pan, H.R., Park, J., Patton, S., Pec, V., Peng, J.C., Pinsky, L., Pun, C.S.J., Qi, F.Z., Qi, M., Qian, X., Raper, N., Ren, J., Rosero, R., Roskovec, B., Ruan, X.C., Steiner, H., Sun, G.X., Sun, J.L., Tang, W., Taychenachev, D., Treskov, K., Tsang, K.V., Tull, C.E., Viaux, N., Viren, B., Vorobel, V., Wang, C.H., Wang, M., Wang, N.Y., Wang, R.G., Wang, W., Wang, X., Wang, Y.F., Wang, Z., Wang, Z.M., Wei, H.Y., Wen, L.J., Whisnant, K., White, C.G., Whitehead, L., Wise, T., Wong, H.L.H., Wong, S.C.F., Worcester, E., Wu, C.H., Wu, Q., Wu, W.J., Xia, D.M., Xia, J.K., Xing, Z.Z., Xu, J.Y., Xu, J.L., Xu, Y., Xue, T., Yang, C.G., Yang, H., Yang, L., Yang, M.S., Yang, M.T., Ye, M., Ye, Z., Yeh, M., Young, B.L., Yu, Z.Y., Zeng, S., Zhan, L., Zhang, C., Zhang, H.H., Zhang, J.W., Zhang, Q.M., Zhang, X.T., Zhang, Y.M., Zhang, Y.X., Zhang, Z.J., Zhang, Z.Y., Zhang, Z.P., Zhao, J., Zhao, Q.W., Zhao, Y.B., Zhong, W.L., Zhou, L., Zhou, N., Zhuang, H.L., Zou, J.H.
Source: Chinese Physics C
Access URL:
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http://repo.scoap3.org/api
Authors: Zhang, Jin-Ying, Xu, Wei-Jiang, Han, G., Carlier, Julien, Ji, X.M., Chen, S.M., Xu, B.
Contributors: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), College of Computer, National University of Defense Technology [China], ASIC and System State Key Lab, Department of Microelectronics, Fudan University [Shanghai], Transduction, Propagation et Imagerie Acoustique - IEMN (TPIA - IEMN), Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 (IEMN-DOAE), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-INSA Institut National des Sciences Appliquées Hauts-de-France (INSA Hauts-De-France)-Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-INSA Institut National des Sciences Appliquées Hauts-de-France (INSA Hauts-De-France), Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN (MAMINA - IEMN), College of Electronic Science and Engineering
Source:
International Congress on Ultrasonics, ICU 2013
International Congress on Ultrasonics, ICU 2013, May 2013, Singapoure, Singapore. Proceedings of the International Congress on Ultrasonics, ICU 2013, pp. 25-30, 2013
Subject Terms: high frequency, ultrasonic linear array, ZnO film, wet etching, finite element method, [SPI]Engineering Sciences [physics]
Access URL:
https://explore.openaire.eu/search/publication?articleId=od______4254::04469e4016a4d30cc67c6e3ec2d1e9c1
https://hal.archives-ouvertes.fr/hal-03709658
Authors: Babulal, S.M., Chen, T.-W., Akilarasan, M., Chen, S.M., Lou, B.-S., Al-onazi, W.A., Al-Mohaimeed, A.M., Elshikh, M.S.
Source: Materials Today Chemistry; December 2022, Vol. 26 Issue: 1
Authors: Huwiler, K., Bruinsma, R., Marks, B., Schweitzer, B., Settineri, T., Shannon, M., Ruff, D., Chen, S.M.
Subject Terms: Poster Session Abstracts
Access URL:
https://explore.openaire.eu/search/publication?articleId=pmc_________::ea9d9e6e5191a25fc57a5546b7054c9d
https://europepmc.org/articles/PMC3186609/
Authors: Shannon, M., Chen, S.M., Mooney, C., Wei, E., Kuo, J., Nguyen, J., Settineri, T., Ruff, D., Swartzman, E.
Subject Terms: Poster Session Abstracts
Access URL:
https://explore.openaire.eu/search/publication?articleId=pmc_________::82af1ed508f1963c30159c69950ee8a8
https://europepmc.org/articles/PMC2918108/
Authors: Nataraj, N., Chen, T.-W., Gan, Z.-W., Chen, S.M., Hatshan, M.R., Ali, M.A.
Source: Materials Today Chemistry; March 2022, Vol. 23 Issue: 1
Authors: Selvi, S.V., Nataraj, N., Chen, T.-W., Chen, S.M., Nagarajan, S., Ko, C.S., Tseng, T.-W., Huang, C.-C.
Source: Materials Today Chemistry; March 2022, Vol. 23 Issue: 1
Authors: Chen, P.T., Liang, T.J., Yang, L.S., Cheng, M.Y., Chen, S.M.
Source: 2010 IEEE Energy Conversion Congress & Exposition (ECCE); 2010, p4035-4040, 6p
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Source: 2010 IEEE Energy Conversion Congress & Exposition (ECCE); 2010, p542-548, 7p
Authors: Jair, D.K., Hsieh, M.C., Lin, C.S., Chen, S.M., Chen, Y.H.
Source: 2009 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS; 2009, p424-427, 4p
Authors: Chen, S.M., Liang, T.J., Chen, J.F.
Source: APCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits & Systems; 2006, p844-847, 4p
Authors: Lin, J.C.H., Yeh, T.H., Lee, C.Y., Chen, C.H., Tsay, J.L., Chen, S.H., Hsu, H.M., Chen, C.W., Huang, C.F., Chiang, J.M., Chang, A., Chang, R.Y., Chang, C.L., Wang, S.H., Wu, C.C., Lin, C.Y., Chu, Y.L., Chen, S.M., Hsu, C.K., Liou, R.S.
Source: Proceedings of the Bipolar/BiCMOS Circuits & Technology Meeting; 2002, p73-79, 7p
Authors: Xu, B.L., Zhang, G., Ye, H.F., Feil, E.J., Chen, G.R., Zhou, X.M., Zhan, X.M., Chen, S.M., Pan, W.B.
Source: Journal of Hospital Infection; Mar2009, Vol. 71 Issue 3, p245-255, 11p
Authors: Chen, S.M., Du, Y., Fan, L.M., He, H.M., Zhong, D.Z.
Source: IEEE Transactions on Electromagnetic Compatibility; Nov2002, Vol. 44 Issue 4, p555, 6p, 1 Black and White Photograph, 1 Diagram, 4 Charts, 2 Graphs, 3 Maps
Subject Terms: LIGHTNING, ELECTRIC fault location
Geographic Terms: CHINA
Authors: Chen, S.M., Du, Y., Fan, L.M., He, H.M., Zhong, D.Z.
Source: IEE Proceedings -- Science, Measurement & Technology; Jan2002, Vol. 149 Issue 1, p9-16, 8p
Authors: Qin, Xu Da, Sun, Xiao Tai, Wang, Q., Chen, S.M., Li, H.
Source: Key Engineering Materials; January 2012, Vol. 499 Issue: 1 p200-204, 5p
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Source: Advanced Materials Research; January 2012, Vol. 426 Issue: 1 p255-259, 5p
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Source: Digestion; 1984, Vol. 29 Issue 1, p5-11, 7p
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Source: Journal of Cellular Plastics; Mar/Apr1986, Vol. 22 Issue 2, p147-166, 20p
Authors: Chen, S.M., Su, Y.K., Lu, Y.T.
Source: IEEE Journal of Quantum Electronics; 1996, Vol. 32 Issue 2, p277-283, 7p