Search Results - Xinyao He
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Managing spot blotch disease in wheat: Conventional to molecular aspects by Roy, Chandan, Xinyao He, Gahtyari, Navin C., Mahapatra, Sunita, Singh, Pawan K.
Published 2023Get full text
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Genetic sources and loci for Fusarium head blight resistance in bread wheat by Lei Wu, Xinyao He, Yi He, Peng Jiang, Kaijie Xu, Xu Zhang, Singh, Pawan K.
Published 2022Get full text
Journal Article -
Screening of CIMMYT and South Asian bread wheat germplasm reveals marker-trait associations for seedling resistance to Septoria nodorum blotch by Mandal, Rupsanatan, Xinyao He, Singh, Gyanendra, Kabir, Muhammad Rezaul, Joshi, Arun Kumar, Singh, Pawan Kumar
Published 2024Get full text
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Novel resistance loci for quantitative resistance to Septoria tritici blotch in Asian wheat (Triticum aestivum) via genome-wide association study by Patial, Madhu, Sudhir Navathe, Xinyao He, Kamble, Umesh, Kumar, Manjeet, Joshi, Arun Kumar, Pawan Kumar Singh
Published 2024Get full text
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Assessment of Indian wheat germplasm for Septoria nodorum blotch and tan spot reveals new QTLs conferring resistance along with recessive alleles of Tsn1 and Snn3 by Sudhir Navathe, Xinyao He, Kamble, Umesh, Kumar, Manjeet, Patial, Madhu, Singh, Gyanendra, Singh, Gyanendra Pratap, Joshi, Arun Kumar, Singh, Pawan Kumar
Published 2023Get full text
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A novel quantitative trait locus on chromosome 7D derived from Aegilops tauschii confers moderate field resistance to wheat blast by Xinyao He, Cong Li, Kishii, Masahiro, Soichiro Asuke, Kabir, Muhammad R., Roy, Krishna K., Butron, Roberto, Chawade, Aakash, Yukio Tosa, Pawan Kumar Singh
Published 2025Get full text
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Genome-wide association mapping for field spot blotch resistance in South Asian spring wheat genotypes by Kamble, Umesh, Xinyao He, Sudhir Navathe, Kumar, Manjeet, Patial, Madhu, Kabir, Muhammad Rezaul, Singh, Gyanendra, Singh, Gyanendra Pratap, Joshi, Arun Kumar, Pawan Kumar Singh
Published 2024Get full text
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Genome-wide association study for resistance to tan spot in synthetic hexaploid wheat by Lozano Ramirez, Nerida, Dreisigacker, Susanne, Sansaloni, Carolina P., Xinyao He, Sandoval-Islas, Sergio, Pérez Rodriguez, Paulino, Carballo-Carballo, Aquiles, Nava Díaz, Cristian, Kishii, Masahiro, Singh, Pawan K.
Published 2022Get full text
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Identification of genomic regions and sources for wheat blast resistance through GWAS in indian wheat genotypes by Phuke, Rahul M., Xinyao He, Juliana, Philomin, Kabir, Muhammad Rezaul, Roy, Krishna K., Marza, Felix, Roy, Chandan, Singh, Gyanendra Pratap, Chawade, Aakash, Joshi, Arun Kumar, Singh, Pawan K.
Published 2022Get full text
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Challenges to wheat disease resistance and current global strategies by Singh, Ravi P., Hodson, David P., Pawan Kumar Singh, Caixia Lan, Xinyao He, Lagudah, Evans S., Juliana, Philomin, Ayliffe, Michael A., Bhavani, Sridhar, Saunders, Diane G.O., Huerta-Espino, Julio
Published 2025Get full text
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Genomic selection for wheat blast in a diversity panel, breeding panel and full-sibs panel by Juliana, Philomin, Xinyao He, Marza, Felix, Islam, Rabiul, Anwar, Md. Babul, Poland, Jesse A., Shrestha, Sandesh, Singh, Gyanendra Pratap, Chawade, Aakash, Joshi, Arun Kumar, Singh, Ravi P., Singh, Pawan K.
Published 2022Get full text
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Genome-wide association mapping indicates quantitative genetic control of spot blotch resistance in bread wheat and the favorable effects of some spot blotch loci on grain yield by Juliana, Philomin, Xinyao He, Poland, Jesse A., Shrestha, Sandesh, Joshi, Arun Kumar, Huerta Espino, Julio, Velu, Govindan, Crespo-Herrera, Leonardo A., Mondal, Suchismita, Kumar, Uttam, Bhati, Pradeep, Vishwakarma, Manish Kumar, Singh, Ravi P., Singh, Pawan K.
Published 2022Get full text
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Genomic selection for spot blotch in bread wheat breeding panels, full-sibs and half-sibs and index-based selection for spot blotch, heading and plant height by Juliana, Philomin, Xinyao He, Poland, Jesse A., Roy, Krishna K., Malaker, Paritosh K., Vinod Kumar Mishra, Chand, Ramesh, Shrestha, Sandesh, Kumar, Uttam, Roy, Chandan, Gahtyari, Navin C., Joshi, Arun Kumar, Singh, Ravi P., Singh, Pawan K.
Published 2022Get full text
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